Fast Localization of Small Inhomogeneities from Far-Field Pattern Data in the Limited-Aperture Inverse Scattering Problem
نویسندگان
چکیده
In this study, we consider a sampling-type algorithm for the fast localization of small electromagnetic inhomogeneities from measured far-field pattern data in limited-aperture inverse scattering problem. For purpose, designed an indicator function based on structure left- and right-singular vectors multistatic response matrix, elements which were data. We then rigorously investigated mathematical terms purely dielectric permittivity magnetic permeability contrast cases by establishing relationship with infinite series Bessel functions integer order first kind range incident observation directions before exploring various intrinsic properties algorithm, including its feasibility limitations. Simulation results synthetic corrupted random noise are presented to support theoretical results.
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ژورنال
عنوان ژورنال: Mathematics
سال: 2021
ISSN: ['2227-7390']
DOI: https://doi.org/10.3390/math9172087